Aging System "High and Low Temperature Testing Machine"
High and low temperature testing, as well as temperature shock testing, are possible! We provide suitable systems according to your needs.
The "High-Low Temperature Testing Machine" is our original system capable of automatic aging function testing from electronic components to finished products. It achieves inline testing from low temperatures (-40°C) to high temperatures (+125°C). We have realized inline high and low temperature aging function testing for various applications from devices (BGA, HIC, etc.) to mounted circuit boards. 【Features】 ■ Can transport 180 workpieces in the chamber with a 25-second cycle time ■ The low-temperature chamber incorporates W coils inside ■ The low-temperature chamber has no time loss for defrosting and allows continuous operation ■ Can be installed in a space-saving manner ■ High-speed movement from the low-temperature side to the high-temperature side enables heat shock testing *For more details, please refer to the PDF document or feel free to contact us.
- Company：ヒーバックシステム
- Price：Other
